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Smart Mining for Deep Metric Learning
Conference proceeding

Smart Mining for Deep Metric Learning

Ben Harwood, Vijay Kumar B.G., Gustavo Carneiro, Ian Reid, Tom Drummond and IEEE
2017 IEEE International Conference on Computer Vision (ICCV), Vol.2017-, pp.2840-2848
10/2017

Abstract

Adaptation models Computational modeling Measurement Monte Carlo methods Robustness Sampling methods Training

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