Abstract
The temperature and pressure dependence of the threshold current of GaInNAs based vertical-cavity surface-emitting lasers (VCSEL) were studied. The temperature variation of the main recombination processes measured in GaInNAs edge emitting lasers (EEL) was used with the same active regions for calculating the temperature and pressure dependence of the threshold current density of VCSELs. It was shown that the VCSEL has the cavity mode on the low energy side of the gain peak at room temperature by comparing the actual lasing photon energies.