Abstract
The results from high-pressure and low-temperature measurements on mid-infrared type-II W-structure lasers suggest that Auger recombination is the major loss process that prevents their continuous-wave operation at room temperature.
Conference presentation
Analysis of the major loss processes in mid-infrared type-II "W" diode lasers
Conference Digest - IEEE International Semiconductor Laser Conference, pp.43-44
2006
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Details
- Title
- Analysis of the major loss processes in mid-infrared type-II "W" diode lasers
- Creators
- K O'BrienAR AdamsSJ SweeneySR JinCN AhmadBN MurdinCL CanedyI VurgaftmanJR Meyer
- Publication Details
- Conference Digest - IEEE International Semiconductor Laser Conference, pp.43-44
- Date published
- 2006
- Date submitted
- 27/05/2010
- Identifiers
- 99514207002346
- Academic Unit
- School of Computer Science and Electronic Engineering; School of Maths and Physics
- Resource Type
- Conference presentation