Determination of the influence of Auger recombination on the threshold current of 1.3 μm and 1.5 μm InGaAs(P) strained-layer lasers and its variation with temperature
Conference Digest - IEEE International Semiconductor Laser Conference, pp.63-64
01/12/1998
Abstract
We investigated the influence of Auger recombination from 90 K to above room temperature and found its contribution to the threshold current at 300 K to be about 80% and 50% at 1.5 μm and at 1.3 μm respectively.
Metrics
46 Record Views
Details
Title
Determination of the influence of Auger recombination on the threshold current of 1.3 μm and 1.5 μm InGaAs(P) strained-layer lasers and its variation with temperature
Creators
SJ Sweeney
AF Phillips
AR Adams
EP O'Reilly
PJA Thijs
Publication Details
Conference Digest - IEEE International Semiconductor Laser Conference, pp.63-64
Date published
01/12/1998
Date submitted
17/05/2017
Identifiers
99513703802346
Academic Unit
University of Surrey; School of Maths and Physics
Resource Type
Journal article
Usage Policy
Usage details for all content viewed and downloaded in this site are shared with IRUS-UK (Institutional Repository Usage Statistics UK). Cookies are used to remember your decision. Click Accept to accept usage details sharing and the cookies.