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Evidence for Metal-Semiconductor Transitions in Twisted and Collapsed Double-Walled Carbon Nanotubes by Scanning Tunneling Microscopy
Journal article   Peer reviewed

Evidence for Metal-Semiconductor Transitions in Twisted and Collapsed Double-Walled Carbon Nanotubes by Scanning Tunneling Microscopy

CE Giusca, Y Tison and SRP Silva
NANO LETTERS, Vol.8(10), pp.3350-3356
01/10/2008
DOI: https://doi.org/10.1021/nl801782k

Abstract

Science & Technology Physical Sciences Technology Chemistry Multidisciplinary Chemistry Physical Nanoscience & Nanotechnology Materials Science Multidisciplinary Physics Applied Physics Condensed Matter Chemistry Science & Technology - Other Topics Materials Science Physics CHEMISTRY MULTIDISCIPLINARY CHEMISTRY PHYSICAL MATERIALS SCIENCE MULTIDISCIPLINARY NANOSCIENCE & NANOTECHNOLOGY PHYSICS APPLIED PHYSICS CONDENSED MATTER ELECTRONIC-STRUCTURE CHEMICAL-REACTIVITY ENERGY DEFORMATION COMPUTATION SURFACES
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