Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz

D. Serghiou; M. Khalily; S. Johny; M. Stanley; Fatadin; T. W. C. Brown; N. Ridler; R. Tafazolli

doi:10.23919/EuCAP51087.2021.9411422

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Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz

D. Serghiou, M. Khalily, S. Johny, M. Stanley, Fatadin, T. W. C. Brown, N. Ridler and R. Tafazolli

2021 15TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP)

Proceedings of the European Conference on Antennas and Propagation

01/01/2021

DOI: https://doi.org/10.23919/EuCAP51087.2021.9411422

Abstract

Engineering, Electrical & Electronic

Science & Technology

Engineering

Technology

Telecommunications

In this paper, an ultra-wideband Terahertz (THz) channel measurement campaign in the 500-750 GHz frequency band is presented. Power levels received from signal transmission by reflections off 14 different materials were measured in an indoor environment at Non-Line-of-Sight (NLoS) between the Transmitter (Tx) and Receiver (Rx), and compared to power levels received at Line-of-Sight (LoS) transmission. Frequency up-converters were used to transmit the signal using 26 dBi horn antennas at the Tx and Rx side and the signal was measured using a Vector Network Analyzer (VNA). From the data collected, the signal losses due to absorption and diffuse scattering from the rough surface of each Material Under Test (MUT) are calculated. The power delay profile (PDP) is presented, where multipath clustering due to diffuse scattering is observed for materials which have a high frequency selectivity, while less scattering and mostly specular reflection is shown for materials with low frequency selectivity.

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Title: Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz
Creators: D. Serghiou - University of Surrey, School of Computer Science and Electronic Engineering
M. Khalily - University of Surrey, School of Computer Science and Electronic Engineering
S. Johny - Natl Phys Lab NPL, Teddington TW1 10LW, Middx, England
M. Stanley - Natl Phys Lab NPL, Teddington TW1 10LW, Middx, England
Fatadin - Natl Phys Lab NPL, Teddington TW1 10LW, Middx, England
T. W. C. Brown - University of Surrey, School of Computer Science and Electronic Engineering
N. Ridler - Natl Phys Lab NPL, Teddington TW1 10LW, Middx, England
R. Tafazolli - University of Surrey, School of Computer Science and Electronic Engineering
Publication Details: 2021 15TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP)
Series: Proceedings of the European Conference on Antennas and Propagation
Publisher: IEEE
Number of pages: 5
Date published: 01/01/2021
Identifiers: 99778709902346
Copyright: This paper's copyright is held by the author(s). It is published in these proceedings and included in any archive such as IEEE Xplore under the license granted by the "Agreement Granting EurAAP Rights Related to Publication of Scholarly Work."
Academic Unit: School of Computer Science and Electronic Engineering
Language: English
Resource Type: Conference proceeding

Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz

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