Abstract
We investigate the wavelength dependence of the catastrophic optical damage current in 980nm lasers. Using high pressure and low temperature techniques, we find an intrinsic dependence of this threshold on wavelength.
Conference presentation
Wavelength dependence of catastrophic optical damage threshold in 980nm semiconductor diode lasers
2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, pp.421-422
16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (TUCSON, AZ, 27/10/2003 - 30/10/2003)
01/01/2003
Metrics
363 File views/ downloads
74 Record Views
Details
- Title
- Wavelength dependence of catastrophic optical damage threshold in 980nm semiconductor diode lasers
- Creators
- D LockStephen SweeneyAlfred Adams
- Contributors
- IEEE (null)
- Publication Details
- 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, pp.421-422
- Conference
- 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (TUCSON, AZ, 27/10/2003 - 30/10/2003)
- Date published
- 01/01/2003
- Date submitted
- 27/05/2010
- Identifiers
- 99516538002346
- Academic Unit
- School of Maths and Physics; School of Computer Science and Electronic Engineering
- Resource Type
- Conference presentation