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Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements
Journal article   Open access   Peer reviewed

Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

R Pagano, J Mukherjee, P Sajewicz and B Corbett
IEEE JOURNAL OF QUANTUM ELECTRONICS, Vol.47(4), pp.439-446
01/04/2011
DOI: https://doi.org/10.1109/JQE.2010.2091255

Abstract

Science & Technology Technology Physical Sciences Engineering Electrical & Electronic Optics Physics Applied research Engineering Physics ENGINEERING ELECTRICAL & ELECTRONIC OPTICS PHYSICS APPLIED Alpha parameter anti-guiding broad area lasers gain guiding gain profile Henry parameter phase extraction stripe lasers AREA SEMICONDUCTOR-LASERS LATERAL-MODES LINEWIDTH GAIN FILAMENTATION SECTION
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