Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

R Pagano; J Mukherjee; P Sajewicz; B Corbett

doi:10.1109/JQE.2010.2091255

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Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

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Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

R Pagano, J Mukherjee, P Sajewicz and B Corbett

IEEE JOURNAL OF QUANTUM ELECTRONICS, Vol.47(4), pp.439-446

01/04/2011

DOI: https://doi.org/10.1109/JQE.2010.2091255

Abstract

Science & Technology

Technology

Physical Sciences

Engineering

Electrical & Electronic

Optics

Physics

Applied

Engineering

Physics

ENGINEERING

ELECTRICAL & ELECTRONIC

OPTICS

PHYSICS

APPLIED

Alpha parameter

anti-guiding

broad area lasers

gain guiding

gain profile

Henry parameter

phase extraction

stripe lasers

AREA SEMICONDUCTOR-LASERS

LATERAL-MODES

LINEWIDTH

GAIN

FILAMENTATION

SECTION

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Title: Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements
Creators: R Pagano
J Mukherjee
P Sajewicz
B Corbett
Publication Details: IEEE JOURNAL OF QUANTUM ELECTRONICS, Vol.47(4), pp.439-446
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Date published: 01/04/2011
Date submitted: 22/10/2012
Identifiers: 99512956402346
Academic Unit: School of Computer Science and Electronic Engineering
Language: English
Resource Type: Journal article

Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

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