Understanding Episode Hardness in Few-Shot Learning
Metrics
Details
- Title
- Understanding Episode Hardness in Few-Shot Learning
- Creators
- Yurong Guo - North China Electric Power UniversityRuoyi Du - Beijing University of Posts and TelecommunicationsAneeshan Sain - University of SurreyKongming Liang - Beijing University of Posts and TelecommunicationsYuan Dong - Beijing University of Posts and TelecommunicationsYi-Zhe Song - University of SurreyZhanyu Ma - Beijing University of Posts and Telecommunications
- Publication Details
- IEEE transactions on pattern analysis and machine intelligence, Vol.PP(1), pp.1-18
- Publisher
- IEEE; LOS ALAMITOS
- Number of pages
- 18
- Publication Date
- 08/10/2024
- Grant note
- National Nature Science Foundation of China: 62225601, 62476029, U23B2052 Beijing Natural Science Foundation: L242025, Z200002 Youth Innovative Research Team of BUPT: 2023YQTD02 Beijing Nova Program
This work was supported in part by the National Nature Science Foundation of China under Grant 62225601, Grant 62476029, and Grant U23B2052, in part by the Beijing Natural Science Foundation under Grant L242025 and Grant Z200002, in part by the Youth Innovative Research Team of BUPT under Grant 2023YQTD02, and in part by Beijing Nova Program. Y. Guo conducted the majority of her part about this work while pursuing the Ph.D. degree at the Pattern Recognition and Intelligent System Laboratory, Beijing University of Posts and Telecommunications. Recommended for acceptance by S.K. Zhou. (Corresponding author: Kongming Liang.)
- Identifiers
- 99928692302346; WOS:001370789100015
- Academic Unit
- School of Computer Science and Electronic Engineering; Centre for Vision, Speech & Signal Processing (CVSSP)
- Language
- English
- Resource Type
- Journal article