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An improved gallium liquid metal ion source geometry for nanotechnology
Conference proceeding   Peer reviewed

An improved gallium liquid metal ion source geometry for nanotechnology

J. J VAN ES, J Gierak, R. G Forties, V. G Suvorov, T VAN DEN BERGHE, Ph Dubuisson, I Monnet, A Septier and Richard G. Forbes
Microelectronic engineering, Vol.73-74, pp.132-138
Proceedings of the 29th Conference on Micro and Nano Engineering, September 22-25, 2003, Cambridge, United Kingdom
06/2004

Abstract

Applied sciences Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing, measurement, noise and reliability

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