Abstract
Secondary ion mass spectrometry (SIMS) is a technique that can be used to provide high resolution images of elements and molecules in 3D, and it has been widely used for material characterisation, particularly of inorganic materials. Recent developments in SIMS instrumentation are now enabling the analysis of organic materials, and there is, therefore, considerable scope for exploitation in forensic science. In this chapter, we describe the principles of operation of SIMS and outline the progress that has been made towards its application in forensic science.