Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy

Journal article

Open access

Peer reviewed

Tim Nunney, Paul Mack, Robin Simpson, Rick Passey, Helen Oppong-Mensah and Mark Baker

Microscopy and microanalysis, Vol.26(S2), pp.1016-1016

01/08/2020

Abstract

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis

url

https://doi.org/10.1017/S1431927620016670View

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Title: Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy
Creators: Tim Nunney - Thermo Fisher Scientific
Paul Mack - Thermo Fisher Scientific
Robin Simpson - Thermo Fisher Scientific
Rick Passey - Thermo Fisher Scientific
Helen Oppong-Mensah - University of Surrey
Mark Baker - University of Surrey
Publication Details: Microscopy and microanalysis, Vol.26(S2), pp.1016-1016
Publisher: Cambridge University Press
Number of pages: 1
Date published: 01/08/2020
Identifiers: 99822631902346
Academic Unit: Department of Mechanical Engineering Sciences
Language: English
Resource Type: Journal article