Abstract
X-ray reflectivity (XRR) and Raman scattering are developed as non-destructive methods to find the density and sp
3 content of unhydrogenated and hydrogenated amorphous carbon films. An empirical relationship is found to derive the sp
3 fraction from visible Raman spectra, while ultraviolet (UV) Raman is able to directly detect sp
3 sites. The sp
3 fraction and density are linearly correlated in amorphous carbon (a-C) and hydrogenated amorphous carbon (a-C:H) films.