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UV fluorescence as a method of high throughput surface cleanliness assessment: A comparison with XPS
Journal article   Peer reviewed

UV fluorescence as a method of high throughput surface cleanliness assessment: A comparison with XPS

M.O. King, M.T. Staff, A.L. White, M. Kopec, M. Stapleton, S.J. Hinder and J.F. Watts
International journal of adhesion and adhesives, Vol.104, p.102739
31/01/2021

Abstract

Surface cleanliness Surface contamination UV–Vis Vapour degreasing XPS

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