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Field emitter electrostatics: Efficient improved simulation technique for highly precise calculation of field enhancement factors
Journal article   Peer reviewed

Field emitter electrostatics: Efficient improved simulation technique for highly precise calculation of field enhancement factors

Fernando F. Dall'Agnol, Thiago A. de Assis and Richard G. Forbes
Journal of Vacuum Science & Technology B, Vol.41, 22803
03/2023

Abstract

Vacuum nanoelectronics Field emitter arrays Electric fields Electrostatics Field emission microscopy Atom-probe field ion microscopy Computer simulation

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