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New imaging algorithm for material damage localisation based on impedance measurements under noise influence
Journal article   Peer reviewed

New imaging algorithm for material damage localisation based on impedance measurements under noise influence

Bruno Albuquerque Castro, Fabricio Guimarães Baptista and FRANCESCO CIAMPA
Measurement : journal of the International Measurement Confederation, Vol.163, 107953
15/10/2020

Abstract

CCSD Damage localisation Imaging algorithm Impedance measurements Probabilistic image SHM Signal Processing

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