Depth Profiling of Fingerprints and ink signals by SIMS and MeV SIMS

Conference presentation

Peer reviewed

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol.268(11-12), pp.1929-1932

07/09/2009

26/02/2010

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http://dx.doi.org/10.1016/j.nimb.2010.02.104View

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Title: Depth Profiling of Fingerprints and ink signals by SIMS and MeV SIMS
Creators: MJ Bailey
BN Jones
RP Webb
S Hinder
J Watts
S Bleay
Contributors: Elsevier (null)
Publication Details: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol.268(11-12), pp.1929-1932
Conference: 07/09/2009
Date published: 26/02/2010
Date submitted: 06/02/2012
Identifiers: 99516847502346
Academic Unit: Department of Mechanical Engineering Sciences; Department of Chemistry
Resource Type: Conference presentation