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Characterization of ion beam synthesized materials using microscope-spectrophotometry
Journal article   Peer reviewed

Characterization of ion beam synthesized materials using microscope-spectrophotometry

RM Geatches, KJ Reeson, AJ Criddle, MS Finney, MA Harry, RP Webb and PJ Pearson
Materials Research Society Symposium Proceedings, Vol.316, pp.813-818
01/01/1994

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