SUBMICRON ELEMENTAL MAPPING WITH THE OXFORD SCANNING PROTON MICROPROBE

GW GRIME; F WATT; J CHAPMAN

doi:10.1016/0168-583X(87)90305-3

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SUBMICRON ELEMENTAL MAPPING WITH THE OXFORD SCANNING PROTON MICROPROBE

Journal article

Peer reviewed

SUBMICRON ELEMENTAL MAPPING WITH THE OXFORD SCANNING PROTON MICROPROBE

GW GRIME, F WATT and J CHAPMAN

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.22(1-3), pp.109-114

01/03/1987

DOI: https://doi.org/10.1016/0168-583X(87)90305-3

Abstract

Science & Technology

Technology

Physical Sciences

Instruments & Instrumentation

Nuclear Science & Technology

Physics

Atomic

Molecular & Chemical

Physics

Nuclear

Physics

INSTRUMENTS & INSTRUMENTATION

NUCLEAR SCIENCE & TECHNOLOGY

PHYSICS

ATOMIC

MOLECULAR & CHEMICAL

PHYSICS

NUCLEAR

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Title: SUBMICRON ELEMENTAL MAPPING WITH THE OXFORD SCANNING PROTON MICROPROBE
Creators: GW GRIME
F WATT
J CHAPMAN
Publication Details: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.22(1-3), pp.109-114
Publisher: ELSEVIER SCIENCE BV
Date published: 01/03/1987
Date submitted: 17/05/2017
Identifiers: 99516805002346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

SUBMICRON ELEMENTAL MAPPING WITH THE OXFORD SCANNING PROTON MICROPROBE

Abstract

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