High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy

AJ Wain; D Cox; S Zhou; A Turnbull

doi:10.1016/j.elecom.2010.11.018

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Journal article

High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy

AJ Wain, D Cox, S Zhou and A Turnbull

ELECTROCHEMISTRY COMMUNICATIONS, Vol.13(1), pp.78-81

01/01/2011

DOI: https://doi.org/10.1016/j.elecom.2010.11.018

Abstract

Science & Technology

Physical Sciences

Electrochemistry

ELECTROCHEMISTRY

SECM

AFM

Combined SECM-AFM

Needle probes

Nanoscale electrochemistry

AC-SECM

NANOELECTRODES

TOPOGRAPHY

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Title: High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy
Creators: AJ Wain
D Cox
S Zhou
A Turnbull
Publication Details: ELECTROCHEMISTRY COMMUNICATIONS, Vol.13(1), pp.78-81
Publisher: ELSEVIER SCIENCE INC
Date published: 01/01/2011
Date submitted: 17/05/2017
Identifiers: 99516785602346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy

Abstract

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