Bayesian error analysis of Rutherford backscattering spectra

NP Barradas; C Jeynes; M Jenkin; PK Marriott

doi:10.1016/S0040-6090(98)01681-2

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Journal article

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Bayesian error analysis of Rutherford backscattering spectra

NP Barradas, C Jeynes, M Jenkin and PK Marriott

THIN SOLID FILMS, Vol.343, pp.31-34

01/04/1999

DOI: https://doi.org/10.1016/S0040-6090(98)01681-2

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Multidisciplinary

Materials Science

Coatings & Films

Physics

Applied

Physics

Condensed Matter

Materials Science

Physics

MATERIALS SCIENCE

COATINGS & FILMS

MATERIALS SCIENCE

MULTIDISCIPLINARY

PHYSICS

APPLIED

PHYSICS

CONDENSED MATTER

Bayesian inference

Markov chain Monte Carlo

Rutherford backscattering

ion beam analysis

ANNEALING ANALYSIS

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Title: Bayesian error analysis of Rutherford backscattering spectra
Creators: NP Barradas
C Jeynes
M Jenkin
PK Marriott
Publication Details: THIN SOLID FILMS, Vol.343, pp.31-34
Publisher: ELSEVIER SCIENCE SA
Date published: 01/04/1999
Date submitted: 17/05/2017
Identifiers: 99515905202346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Bayesian error analysis of Rutherford backscattering spectra

Abstract

Files and links (1)

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