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Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing
Journal article   Peer reviewed

Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing

NP Barradas, C Jeynes, RP Webb, U Kreissig and R Grotzschel
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.149(1-2), pp.233-237
01/01/1999
DOI: https://doi.org/10.1016/S0168-583X(98)00731-9

Abstract

Science & Technology Technology Physical Sciences Instruments & Instrumentation Nuclear Science & Technology Physics Atomic Molecular & Chemical Physics Nuclear Physics INSTRUMENTS & INSTRUMENTATION NUCLEAR SCIENCE & TECHNOLOGY PHYSICS ATOMIC MOLECULAR & CHEMICAL PHYSICS NUCLEAR Rutherford backscattering elastic recoil detection analysis Simulated Annealing RUTHERFORD
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