- Title
- A Comparative Study of Interaction of End of Range (EOR) Defect Band with Upper Buried Oxide (BOX) Interface for B and BF(2) Implants in SOI and Bulk Silicon with Pre-Amorphizing Implant
- Creators
- M KahAJ SmithJJ HamiltonSH YeongB ColumbeauR GwilliamRP WebbKJ Kirkby
- Contributors
- EG SeebauerYV KondratenkoSB FelchA JainAMER INST PHYSICS (Publisher)
- Publication Details
- ION IMPLANTATION TECHNOLOGY 2008, Vol.1066, pp.51-54
- Conference
- 17th International Conference on Ion Implantation Technology (Monterey, CA, 08/06/2008–13/06/2008)
- Publication Date
- 01/01/2008
- Identifiers
- 99515798102346
- Academic Unit
- University of Surrey
- Resource Type
- Conference presentation
Conference presentation
A Comparative Study of Interaction of End of Range (EOR) Defect Band with Upper Buried Oxide (BOX) Interface for B and BF(2) Implants in SOI and Bulk Silicon with Pre-Amorphizing Implant
ION IMPLANTATION TECHNOLOGY 2008, Vol.1066, pp.51-54
17th International Conference on Ion Implantation Technology (Monterey, CA, 08/06/2008–13/06/2008)
01/01/2008