Electron beam quality control using an amorphous silicon EPID

JA Beck; GJ Budgell; DA Roberts; PM Evans

doi:10.1118/1.3110671

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Electron beam quality control using an amorphous silicon EPID

Journal article

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Peer reviewed

Electron beam quality control using an amorphous silicon EPID

JA Beck, GJ Budgell, DA Roberts and PM Evans

MEDICAL PHYSICS, Vol.36(5), pp.1859-1866

05/2009

DOI: https://doi.org/10.1118/1.3110671

Abstract

amorphous semiconductors

biomedical equipment

biomedical imaging

electron beams

linear accelerators

quality control

radiation therapy

silicon radiation detectors

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Title: Electron beam quality control using an amorphous silicon EPID
Creators: JA Beck
GJ Budgell
DA Roberts
PM Evans
Publication Details: MEDICAL PHYSICS, Vol.36(5), pp.1859-1866
Publisher: American Association of Physicists in Medicine
Publication Date: 05/2009
Identifiers: 99515739802346; WOS:000265526800046
Academic Unit: School of Computer Science and Electronic Engineering
Resource Type: Journal article

Electron beam quality control using an amorphous silicon EPID

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