Structural analysis of organic interfacial layers by ellipsometry

JL Keddie

doi:10.1016/S1359-0294(01)00070-X

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Structural analysis of organic interfacial layers by ellipsometry

Journal article

Peer reviewed

Structural analysis of organic interfacial layers by ellipsometry

JL Keddie

CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, Vol.6(2), pp.102-110

01/04/2001

DOI: https://doi.org/10.1016/S1359-0294(01)00070-X

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

ellipsometry

adsorption

reflectivity

thin films

data inversion

surface excess

solution ambiguity

surfaces

interfaces

polymers

surfactants

critical phenomena

AIR-WATER-INTERFACE

INFRARED SPECTROSCOPIC ELLIPSOMETRY

NONIONIC SURFACTANTS

PROTEIN ADSORPTION

BETA-CASEIN

SOLID/LIQUID INTERFACE

OVERFLOWING CYLINDER

NEUTRON REFLECTION

DIBLOCK COPOLYMERS

OPTICAL TECHNIQUES

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Title: Structural analysis of organic interfacial layers by ellipsometry
Creators: JL Keddie
Publication Details: CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, Vol.6(2), pp.102-110
Publisher: ELSEVIER SCIENCE LONDON
Date published: 01/04/2001
Date submitted: 17/05/2017
Identifiers: 99515659402346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Structural analysis of organic interfacial layers by ellipsometry

Abstract

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