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A comparison of in situ polishing and ion beam sputtering as surface preparation methods for XPS analysis of PVD coatings
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A comparison of in situ polishing and ion beam sputtering as surface preparation methods for XPS analysis of PVD coatings

MA Baker, SJ Greaves, E Wendler and V Fox
THIN SOLID FILMS, Vol.377, pp.473-477
27th International Conference on Metallurgical Coatings and Thin Films (SAN DIEGO, CALIFORNIA, 10/04/2000 - 14/04/2000)
01/12/2000

Abstract

Science & Technology Technology Physical Sciences Materials Science Multidisciplinary Materials Science Coatings & Films Physics Applied Physics Condensed Matter Materials Science Physics MATERIALS SCIENCE COATINGS & FILMS MATERIALS SCIENCE MULTIDISCIPLINARY PHYSICS APPLIED PHYSICS CONDENSED MATTER XPS in situ polishing sputtering PVD coatings RAY PHOTOELECTRON-SPECTROSCOPY AUGER-ELECTRON SPECTROSCOPY BACKSCATTERING FILMS TIN
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