APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY

MBH BREESE; JP LANDSBERG; PJC KING; GW GRIME; F WATT

doi:10.1016/0168-583X(92)95524-U

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APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY

Conference presentation

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APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY

MBH BREESE, JP LANDSBERG, PJC KING, GW GRIME and F WATT

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.64(1-4), pp.505-511

10TH INTERNATIONAL CONF ON ION BEAM ANALYSIS (EINDHOVEN UNIV TECHNOL, EINDHOVEN, NETHERLANDS, 01/07/1991 - 05/07/1991)

01/02/1992

DOI: https://doi.org/10.1016/0168-583X(92)95524-U

Abstract

Science & Technology

Technology

Physical Sciences

Instruments & Instrumentation

Nuclear Science & Technology

Physics

Atomic

Molecular & Chemical

Physics

Nuclear

Physics

INSTRUMENTS & INSTRUMENTATION

NUCLEAR SCIENCE & TECHNOLOGY

PHYSICS

ATOMIC

MOLECULAR & CHEMICAL

PHYSICS

NUCLEAR

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Title: APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY
Creators: MBH BREESE
JP LANDSBERG
PJC KING
GW GRIME
F WATT
Contributors: ELSEVIER SCIENCE BV (Publisher)
Publication Details: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.64(1-4), pp.505-511
Conference: 10TH INTERNATIONAL CONF ON ION BEAM ANALYSIS (EINDHOVEN UNIV TECHNOL, EINDHOVEN, NETHERLANDS, 01/07/1991 - 05/07/1991)
Date published: 01/02/1992
Date submitted: 17/05/2017
Identifiers: 99515605802346
Academic Unit: University of Surrey
Resource Type: Conference presentation

APPLICATIONS OF SCANNING-TRANSMISSION ION MICROSCOPY

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