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A pattern matching and active simulation method for process fault diagnosis
Journal article   Open access  Peer reviewed

A pattern matching and active simulation method for process fault diagnosis

Weijun Li, Sai Gu, Xiangping Zhang and Tao Chen
Industrial & Engineering Chemistry Research
08/06/2020

Abstract

Fault diagnosis; Pattern matching; Dynamic simulation; Multiple faults; Active simulation; Digital Twin
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http://dx.doi.org/10.1021/acs.iecr.0c02424View
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