ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

SJ Hinder; C Lowe; JF Watts

doi:10.1002/sia.2546

Back

ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

Journal article

Open access

Peer reviewed

ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

SJ Hinder, C Lowe and JF Watts

SURFACE AND INTERFACE ANALYSIS, Vol.39(6), pp.467-475

01/06/2007

DOI: https://doi.org/10.1002/sia.2546

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

time-of-flight secondary ion mass spectrometry

depth profiling

C-60

coil coatings

polymer

ION MASS-SPECTROMETRY

HIGH-RESOLUTION XPS

BUCKMINSTERFULLERENE PROBE

ORGANIC MATERIALS

STATIC SIMS

FILMS

BOMBARDMENT

PROJECTILES

BEAM

AG

Files and links (3)

pdf

ToF-SIMS Depth Profiling of a Complex Polymeric Coating Em…1.27 MBDownload View

TextSRIDA, Open Access

url

http://dx.doi.org/10.1002/sia.2546View

Published (Version of record)

url

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000246561800001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View

Author

Metrics

503 File views/ downloads

45 Record Views

20 Times Cited - Web of Science

Details

Title: ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source
Creators: SJ Hinder
C Lowe
JF Watts
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.39(6), pp.467-475
Publisher: JOHN WILEY & SONS LTD
Date published: 01/06/2007
Date submitted: 12/11/2012
Identifiers: 99515439502346
Academic Unit: Department of Mechanical Engineering Sciences
Language: English
Resource Type: Journal article

ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

Abstract

Files and links (3)

Metrics

Details

Usage Policy