Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

C Perruchot; JF Watts; C Lowe; RG White; PJ Cumpson

doi:10.1002/sia.1465

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Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

Journal article

Peer reviewed

Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

C Perruchot, JF Watts, C Lowe, RG White and PJ Cumpson

SURFACE AND INTERFACE ANALYSIS, Vol.33(10-11), pp.869-878

01/10/2002

DOI: https://doi.org/10.1002/sia.1465

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

angle-resolved XPS

elemental and chemical depth profiles

epoxy and urea formaldehyde resins

flow agent additives

THIN-FILMS

DEPTH-RESOLUTION

DEPOSITION

THICKNESS

ALUMINUM

RESINS

IRON

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Title: Angle-resolved XPS characterization of urea formaldehyde-epoxy systems
Creators: C Perruchot
JF Watts
C Lowe
RG White
PJ Cumpson
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.33(10-11), pp.869-878
Publisher: WILEY-BLACKWELL
Date published: 01/10/2002
Date submitted: 17/05/2017
Identifiers: 99515411402346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

Abstract

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