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P1-26: Influence of tip curvature on field electron emission characteristics
Conference presentation

P1-26: Influence of tip curvature on field electron emission characteristics

A Fischer, MS Mousa, AN Al-Rabadi and RG Forbes
Proccedings of 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, pp.78-78
23rd IVNC 2010 (Palo Alto, USA, 26/07/2010 - 30/07/2010)
26/07/2010

Abstract

This poster explores the influence of tip curvature on field electron emission characteristics. We look at predicted changes in: Fowler-Nordheim plots (which tend to become curved); the dependence of notional emission area on voltage; and the slope and intercept correction functions.

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