NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS

JL KEDDIE; LJ NORTON; EJ KRAMER; EP GIANNELIS

doi:10.1111/j.1151-2916.1993.tb03978.x

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NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS

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NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS

JL KEDDIE, LJ NORTON, EJ KRAMER and EP GIANNELIS

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, Vol.76(10), pp.2534-2538

01/10/1993

DOI: https://doi.org/10.1111/j.1151-2916.1993.tb03978.x

Abstract

Science & Technology

Technology

Materials Science

Ceramics

Materials Science

MATERIALS SCIENCE

CERAMICS

TIO2-SIO2 GLASSES

CRYSTALLIZATION

LAYER

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Title: NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS
Creators: JL KEDDIE
LJ NORTON
EJ KRAMER
EP GIANNELIS
Publication Details: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, Vol.76(10), pp.2534-2538
Publisher: AMER CERAMIC SOC
Date published: 01/10/1993
Date submitted: 17/05/2017
Identifiers: 99515358802346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS

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