An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K

BJ Jones; RC Barklie; G Smith; H El Mkami; JD Carey; SRP Silva

doi:10.1016/S0925-9635(03)00012-8

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An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K

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An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K

BJ Jones, RC Barklie, G Smith, H El Mkami, JD Carey and SRP Silva

DIAMOND AND RELATED MATERIALS, Vol.12(2), pp.116-123

4th Specialist Meeting on Amorphous Carbon (SMAC 2002) (UNIV BARCELONA, DEPT APPL PHYS & OPT, BARCELONA, SPAIN, 05/09/2002 - 06/09/2002)

01/02/2003

DOI: https://doi.org/10.1016/S0925-9635(03)00012-8

Abstract

Science & Technology

Technology

Materials Science

Multidisciplinary

Materials Science

MATERIALS SCIENCE

MULTIDISCIPLINARY

defects

EPR

anisotropy

amorphous carbon

TETRAHEDRAL AMORPHOUS-CARBON

ELECTRON-PARAMAGNETIC-RESONANCE

SPIN-RESONANCE

HYDROGENATED CARBON

CENTERS

SPECTROSCOPY

IMPLANTATION

DEPENDENCE

ENERGY

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Title: An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K
Creators: BJ Jones
RC Barklie
G Smith
H El Mkami
JD Carey
SRP Silva
Contributors: ELSEVIER SCIENCE SA (Publisher)
Publication Details: DIAMOND AND RELATED MATERIALS, Vol.12(2), pp.116-123
Conference: 4th Specialist Meeting on Amorphous Carbon (SMAC 2002) (UNIV BARCELONA, DEPT APPL PHYS & OPT, BARCELONA, SPAIN, 05/09/2002 - 06/09/2002)
Date published: 01/02/2003
Date submitted: 17/05/2017
Identifiers: 99515303902346
Academic Unit: University of Surrey
Resource Type: Conference presentation

An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K

Abstract

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