Surrey researchers Sign in
Back
On the processing-structure-property relationship of ITO layers deposited on crystalline and amorphous Si
Conference presentation   Peer reviewed

On the processing-structure-property relationship of ITO layers deposited on crystalline and amorphous Si

S Diplas, A Ulyashin, K Maknys, AE Gunnaes, S Jorgensen, D Wright, JF Watts, A Olsen and TG Finstad
THIN SOLID FILMS, Vol.515(24), pp.8539-8543
1st International Symposium on Transparent Conducting Oxides (Crete, GREECE, 23/10/2006 - 25/10/2006)
15/10/2007
DOI: https://doi.org/10.1016/j.tsf.2007.03.091

Abstract

Science & Technology Technology Physical Sciences Materials Science Multidisciplinary Materials Science Coatings & Films Physics Applied Physics Condensed Matter Materials Science Physics MATERIALS SCIENCE COATINGS & FILMS MATERIALS SCIENCE MULTIDISCIPLINARY PHYSICS APPLIED PHYSICS CONDENSED MATTER ITO magnetron sputtering AFM XPS TEM IN2O3 THIN-FILMS SOLAR-CELLS INTERFACES
url
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000250497000023&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View
Author

Metrics

31 Record Views

Details

Usage Policy

Usage details for all content viewed and downloaded in this site are shared with IRUS-UK (Institutional Repository Usage Statistics UK). Cookies are used to remember your decision. Click Accept to accept usage details sharing and the cookies.

Learn more