IR ellipsometry of crosslinking in silicone coatings: Effect of thickness

TRE Simpson; JL Keddie; B Parbhoo

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IR ellipsometry of crosslinking in silicone coatings: Effect of thickness

TRE Simpson, JL Keddie and B Parbhoo

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, Vol.225, pp.U702-U702

225th National Meeting of the American-Chemical-Society (NEW ORLEANS, LOUISIANA, 23/03/2003 - 27/03/2003)

01/03/2003

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Science & Technology

Physical Sciences

Chemistry

Multidisciplinary

Chemistry

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Title: IR ellipsometry of crosslinking in silicone coatings: Effect of thickness
Creators: TRE Simpson
JL Keddie
B Parbhoo
Contributors: AMER CHEMICAL SOC (Publisher)
Publication Details: ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, Vol.225, pp.U702-U702
Conference: 225th National Meeting of the American-Chemical-Society (NEW ORLEANS, LOUISIANA, 23/03/2003 - 27/03/2003)
Date published: 01/03/2003
Date submitted: 17/05/2017
Identifiers: 99514919102346
Academic Unit: University of Surrey
Resource Type: Conference presentation

IR ellipsometry of crosslinking in silicone coatings: Effect of thickness

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