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A ToF-SIMS investigation of a buried polymer/polymer interface exposed by ultra-low-angle microtomy
Journal article   Open access   Peer reviewed

A ToF-SIMS investigation of a buried polymer/polymer interface exposed by ultra-low-angle microtomy

SJ Hinder, C Lowe, JT Maxted and JF Watts
SURFACE AND INTERFACE ANALYSIS, Vol.36(12), pp.1575-1581
01/12/2004

Abstract

Science & Technology Physical Sciences Chemistry Physical Chemistry time-of-flight secondary ion mass spectrometry buried interface ultra-low-angle microtomy multilayer coatings imaging SIMS HIGH-RESOLUTION XPS CROSS-LINKING SPECTROSCOPY SEGREGATION COATINGS RESINS FORMULATION SYSTEMS FILMS
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A ToF-SIMS Investigation of a Buried Polymer-Polymer Interface Exposed by Ultra-Low-Angle Microtomy497.50 kBDownloadView
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http://dx.doi.org/10.1002/sia.1985View
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