EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE

PJC KING; MBH BREESE; PJM SMULDERS; AJ WILKINSON; GR BOOKER; EHC PARKER; GW GRIME

doi:10.1063/1.115319

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EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE

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EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE

PJC KING, MBH BREESE, PJM SMULDERS, AJ WILKINSON, GR BOOKER, EHC PARKER and GW GRIME

APPLIED PHYSICS LETTERS, Vol.67(24), pp.3566-3568

11/12/1995

DOI: https://doi.org/10.1063/1.115319

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Science & Technology

Physical Sciences

Physics

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Physics

PHYSICS

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Title: EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE
Creators: PJC KING
MBH BREESE
PJM SMULDERS
AJ WILKINSON
GR BOOKER
EHC PARKER
GW GRIME
Publication Details: APPLIED PHYSICS LETTERS, Vol.67(24), pp.3566-3568
Publisher: AMER INST PHYSICS
Date published: 11/12/1995
Date submitted: 17/05/2017
Identifiers: 99514394702346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE

Abstract

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