QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM

M JAKSIC; GW GRIME; J HENDERSON; F WATT

doi:10.1016/0168-583X(91)95397-V

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QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM

Journal article

Peer reviewed

QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM

M JAKSIC, GW GRIME, J HENDERSON and F WATT

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.54(4), pp.491-498

01/04/1991

DOI: https://doi.org/10.1016/0168-583X(91)95397-V

Abstract

Science & Technology

Technology

Physical Sciences

Instruments & Instrumentation

Nuclear Science & Technology

Physics

Atomic

Molecular & Chemical

Physics

Nuclear

Physics

INSTRUMENTS & INSTRUMENTATION

NUCLEAR SCIENCE & TECHNOLOGY

PHYSICS

ATOMIC

MOLECULAR & CHEMICAL

PHYSICS

NUCLEAR

X-RAY-EMISSION

SI(LI) DETECTORS

CROSS-SECTIONS

EFFICIENCY DETERMINATION

SHELL IONIZATION

K-SHELL

INTENSITIES

CALIBRATION

ROUGHNESS

ENERGIES

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Title: QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM
Creators: M JAKSIC
GW GRIME
J HENDERSON
F WATT
Publication Details: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.54(4), pp.491-498
Publisher: ELSEVIER SCIENCE BV
Date published: 01/04/1991
Date submitted: 17/05/2017
Identifiers: 99514233002346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM

Abstract

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