Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip

E Brown; L Hao; DC Cox; JC Gallop; LSO Johansson; JN Andersen; M Gothelid; U Helmersson; L Montelius; M Rubel; J Setina; LE Wernersson

doi:10.1088/1742-6596/100/5/052012

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Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip

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Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip

E Brown, L Hao, DC Cox, JC Gallop, LSO Johansson, JN Andersen, M Gothelid, U Helmersson, L Montelius, M Rubel, …

PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, Vol.100, pp.?-?

17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology (Stockholm, SWEDEN, 02/07/2007 - 06/07/2007)

01/01/2008

DOI: https://doi.org/10.1088/1742-6596/100/5/052012

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Science & Technology

Technology

Physical Sciences

Nanoscience & Nanotechnology

Materials Science

Coatings & Films

Physics

Applied

Science & Technology - Other Topics

Materials Science

Physics

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Title: Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip
Creators: E Brown
L Hao
DC Cox
JC Gallop
LSO Johansson
JN Andersen
M Gothelid
U Helmersson
L Montelius
M Rubel
J Setina
LE Wernersson
Contributors: IOP PUBLISHING LTD (null)
Publication Details: PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, Vol.100, pp.?-?
Conference: 17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology (Stockholm, SWEDEN, 02/07/2007 - 06/07/2007)
Date published: 01/01/2008
Date submitted: 19/10/2012
Identifiers: 99514148702346
Academic Unit: School of Computer Science and Electronic Engineering
Resource Type: Conference presentation

Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip

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