Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

C Jeynes; G Zoppi; I Forbes; MJ Bailey; N Peng

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Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

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Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

C Jeynes, G Zoppi, I Forbes, MJ Bailey and N Peng

2009 INTERNATIONAL CONFERENCE ON SUSTAINABLE POWER GENERATION AND SUPPLY, VOLS 1-4, pp.1294-1299

International Conference on Sustainable Power Generation and Supply (Nanjing, PEOPLES R CHINA, 06/04/2009 - 07/04/2009)

01/01/2009

Abstract

Science & Technology

Energy & Fuels

Electrical & Electronic

Photovoltaic cell materials

Materials science and technology

Semiconductor films

Thin film devices

Ion beam applications

SIMULTANEOUS PIXE

CROSS-SECTION

RBS

IBA

DATAFURNACE

ROUGHNESS

SILICON

Technology

Engineering

Software

Scattering

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Title: Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis
Creators: C Jeynes
G Zoppi
I Forbes
MJ Bailey
N Peng
Contributors: IEEE (null)
Publication Details: 2009 INTERNATIONAL CONFERENCE ON SUSTAINABLE POWER GENERATION AND SUPPLY, VOLS 1-4, pp.1294-1299
Conference: International Conference on Sustainable Power Generation and Supply (Nanjing, PEOPLES R CHINA, 06/04/2009 - 07/04/2009)
Date published: 01/01/2009
Date submitted: 03/08/2012
Identifiers: 99514007102346
Academic Unit: School of Computer Science and Electronic Engineering; Department of Chemistry
Resource Type: Conference presentation

Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

Abstract

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