AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON

AC KIMBER; C JEYNES

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AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON

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AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON

AC KIMBER and C JEYNES

JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C-APPLIED STATISTICS, Vol.36(3), pp.352-357

01/01/1987

Abstract

Science & Technology

Physical Sciences

Statistics & Probability

Mathematics

STATISTICS & PROBABILITY

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Title: AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON
Creators: AC KIMBER
C JEYNES
Publication Details: JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C-APPLIED STATISTICS, Vol.36(3), pp.352-357
Publisher: WILEY-BLACKWELL
Publication Date: 01/01/1987
Identifiers: 99513976702346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON

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