SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER

M MURTAGH; GM CREAN; T FLAHERTY; C JEYNES

doi:10.1016/0169-4332(92)90094-E

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SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER

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SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER

M MURTAGH, GM CREAN, T FLAHERTY and C JEYNES

APPLIED SURFACE SCIENCE, Vol.54, pp.497-501

SYMP OF THE 1991 SPRING CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : LASER SURFACE PROCESSING AND CHARACTERIZATION (STRASBOURG, FRANCE, 28/05/1991–31/05/1991)

01/01/1992

DOI: https://doi.org/10.1016/0169-4332(92)90094-E

Abstract

Science & Technology

Physical Sciences

Technology

Chemistry

Physical

Materials Science

Coatings & Films

Physics

Applied

Physics

Condensed Matter

Chemistry

Materials Science

Physics

CHEMISTRY

PHYSICAL

MATERIALS SCIENCE

COATINGS & FILMS

PHYSICS

APPLIED

PHYSICS

CONDENSED MATTER

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Title: SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER
Creators: M MURTAGH
GM CREAN
T FLAHERTY
C JEYNES
Contributors: ELSEVIER SCIENCE BV (Publisher)
Publication Details: APPLIED SURFACE SCIENCE, Vol.54, pp.497-501
Conference: SYMP OF THE 1991 SPRING CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : LASER SURFACE PROCESSING AND CHARACTERIZATION (STRASBOURG, FRANCE, 28/05/1991–31/05/1991)
Publication Date: 01/01/1992
Identifiers: 99513765002346
Academic Unit: University of Surrey
Resource Type: Conference presentation

SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER

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