Characteristics of focused ion beam nanoscale Josephson devices

L Hao; DC Cox; JC Gallop

doi:10.1088/0953-2048/22/6/064011

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Characteristics of focused ion beam nanoscale Josephson devices

Journal article

Peer reviewed

Characteristics of focused ion beam nanoscale Josephson devices

L Hao, DC Cox and JC Gallop

SUPERCONDUCTOR SCIENCE & TECHNOLOGY, Vol.22(6), ARTN 06401

01/06/2009

DOI: https://doi.org/10.1088/0953-2048/22/6/064011

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

Condensed Matter

Physics

PHYSICS

APPLIED

PHYSICS

CONDENSED MATTER

QUANTUM INTERFERENCE DEVICE

WEAK LINKS

SQUIDS

SUPERCONDUCTORS

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Title: Characteristics of focused ion beam nanoscale Josephson devices
Creators: L Hao
DC Cox
JC Gallop
Publication Details: SUPERCONDUCTOR SCIENCE & TECHNOLOGY, Vol.22(6), ARTN 06401
Publisher: IOP PUBLISHING LTD
Date published: 01/06/2009
Date submitted: 17/05/2017
Identifiers: 99513761602346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Characteristics of focused ion beam nanoscale Josephson devices

Abstract

Files and links (1)

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