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Approaches to analyzing insulators with Auger electron spectroscopy: Update and overview
Journal article   Open access   Peer reviewed

Approaches to analyzing insulators with Auger electron spectroscopy: Update and overview

DR Baer, AS Lea, JD Geller, JS Hammond, L Kover, CJ Powell, MP Seah, M Suzuki, JF Watts and J Wolstenholme
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Vol.176(1-3), pp.80-94
01/01/2010

Abstract

Science & Technology Technology Spectroscopy Auger electron spectroscopy Surface charging Surface analysis Practical guide SURFACE-ANALYSIS STRUCTURE CERAMICS SAM MICROANALYSIS AES CHARGE MICROSCOPY BACKSIDE GLASS MECHANISMS REDUCTION
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http://dx.doi.org/10.1016/j.elspec.2009.03.021View
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