Abstract
The truncated two-piece normal distribution is applied to data obtained from backscattering experiments in order to investigate the depth of arsenic implants in silicon.
- Title
- APPLICATION OF THE TRUNCATED TWO-PIECE NORMAL DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON.
- Creators
- AC KimberC Jeynes
- Publication Details
- Journal of the Royal Statistical Society. Series C: Applied Statistics, Vol.36(3), pp.352-357
- Date published
- 01/12/1987
- Date submitted
- 17/05/2017
- Identifiers
- 99513531902346
- Academic Unit
- University of Surrey
- Resource Type
- Journal article