XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

SFA Sani; GA Mahdiraji; ASS Shafiqah; GW Grime; V Palitsin; SJ Hinder; N Tamchek; HAA Rashid; MJ Maah; JF Watts; DA Bradley

doi:10.1109/JLT.2015.2406394

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XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

Journal article

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XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

SFA Sani, GA Mahdiraji, ASS Shafiqah, GW Grime, V Palitsin, SJ Hinder, N Tamchek, HAA Rashid, MJ Maah, JF Watts, …

JOURNAL OF LIGHTWAVE TECHNOLOGY, Vol.33(11), pp.2268-2278

01/06/2015

DOI: https://doi.org/10.1109/JLT.2015.2406394

Abstract

Science & Technology

Technology

Physical Sciences

Engineering

Electrical & Electronic

Optics

Telecommunications

Engineering

Doped SiO2 fibres

dosimetry

particle-induced X-ray emission (PIXE)

photonic crystal fibre (PCF)

X-ray photoelectron spectroscopy (XPS)

PHOTONIC CRYSTAL FIBERS

ABSORPTION-BANDS

OPTICAL-FIBERS

SIO2

GE

GENERATION

GERMANIUM

DEFECTS

GLASSES

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Title: XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry
Creators: SFA Sani
GA Mahdiraji
ASS Shafiqah
GW Grime
V Palitsin
SJ Hinder
N Tamchek
HAA Rashid
MJ Maah
JF Watts
DA Bradley
Publication Details: JOURNAL OF LIGHTWAVE TECHNOLOGY, Vol.33(11), pp.2268-2278
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Date published: 01/06/2015
Date submitted: 01/11/2015
Identifiers: 99513502702346
Academic Unit: University of Surrey; School of Maths and Physics
Language: English
Resource Type: Journal article

XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

Abstract

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