Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

GW Grime

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Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

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Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

GW Grime

ACTA PHYSICA POLONICA A, Vol.115(2), pp.467-472

42nd Zakopane School of Physics International Symposium Breaking Frontiers (Zakopane, POLAND, 19/05/2008 - 25/05/2008)

01/02/2009

Abstract

Science & Technology

Physical Sciences

Physics

Multidisciplinary

Physics

PHYSICS

MULTIDISCIPLINARY

NUCLEAR MICROPROBE

SINGLE

NANOBEAM

FACILITY

LITHOGRAPHY

IRRADIATION

FABRICATION

SIMULATION

NANOPROBE

MICROBEAM

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Title: Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects
Creators: GW Grime
Contributors: POLISH ACAD SCIENCES INST PHYSICS (Publisher)
Publication Details: ACTA PHYSICA POLONICA A, Vol.115(2), pp.467-472
Conference: 42nd Zakopane School of Physics International Symposium Breaking Frontiers (Zakopane, POLAND, 19/05/2008 - 25/05/2008)
Date published: 01/02/2009
Date submitted: 17/05/2017
Identifiers: 99513469602346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

Abstract

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