Application of ellipsometry to polymers at interfaces and in thin films

D Styrkas; SJ Doran; T Gilchrist; JL Keddie; JR Lu; E Murphy; R Sackin; TJ Su; A Tzitzinou

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Application of ellipsometry to polymers at interfaces and in thin films

D Styrkas, SJ Doran, T Gilchrist, JL Keddie, JR Lu, E Murphy, R Sackin, TJ Su and A Tzitzinou

POLYMER SURFACES AND INTERFACES III, pp.1-42

Conference on Polymer Surfaces and Interfaces III (DURHAM UNIV, DURHAM, ENGLAND, 07/1997)

01/01/1999

Abstract

Science & Technology

Physical Sciences

Chemistry

Applied

Chemistry

Multidisciplinary

Physics

Applied

Physics

Multidisciplinary

Polymer Science

Chemistry

Physics

SELF-ASSEMBLED MONOLAYERS

ATOMIC-FORCE MICROSCOPY

SPECTROSCOPIC ELLIPSOMETRY

SURFACE-ROUGHNESS

GLASS-TRANSITION

NEUTRON REFLECTION

WATER-INTERFACE

ACRYLIC LATICES

THICKNESS

PRECISION

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Title: Application of ellipsometry to polymers at interfaces and in thin films
Creators: D Styrkas
SJ Doran
T Gilchrist
JL Keddie
JR Lu
E Murphy
R Sackin
TJ Su
A Tzitzinou
Contributors: RW Richards
SK Peace
JOHN WILEY & SONS INC (Publisher)
Publication Details: POLYMER SURFACES AND INTERFACES III, pp.1-42
Conference: Conference on Polymer Surfaces and Interfaces III (DURHAM UNIV, DURHAM, ENGLAND, 07/1997)
Date published: 01/01/1999
Date submitted: 17/05/2017
Identifiers: 99513076602346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Application of ellipsometry to polymers at interfaces and in thin films

Abstract

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