- Title
- Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS
- Creators
- BN JonesV PalitsinR Webb
- Contributors
- ELSEVIER SCIENCE BV (null)
- Publication Details
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.268(11-12), pp.1714-1717
- Conference
- 19th International Conference on Ion Beam Analysis (Univ Cambridge, Cambridge, ENGLAND, 07/09/2009 - 11/09/2009)
- Date published
- 01/06/2010
- Date submitted
- 18/10/2012
- Identifiers
- 99513069602346
- Academic Unit
- University of Surrey
- Resource Type
- Conference presentation
Conference presentation
Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.268(11-12), pp.1714-1717
19th International Conference on Ion Beam Analysis (Univ Cambridge, Cambridge, ENGLAND, 07/09/2009 - 11/09/2009)
01/06/2010
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